Optical Antireflective Layered and Nanoporous Metamaterials for Optoelectronic Devices

Abstract

This paper presents an overview of new ideas for creating antireflective coatings for protective glasses of optoelectronic devices based on layered and matrix metamaterials with extended functionality. Attention is drawn to such important types of metamaterials as layered porous and polymer composite nanomaterials. For layered antireflective nanostructures, distinctive optical properties of coatings achieved by controlling the composition and thickness of the layers are highlighted. Composites of silicon and titanium dioxide are considered the main materials of multilayer coatings. For single-layer coatings, attention is paid to polymer matrix composite nanomaterials based on polymethyl methacrylate with the inclusion of silver nanoparticles. Metaglasses (glass plates with a two-layer deposition of silver films) or membranes made of porous anodic aluminum oxide with a thin gold film are proposed to be used as electrically conductive transparent optical elements. The article discusses the technology of creating antireflective coatings and their optical properties. At the same time, among many known technological methods for creating antireflective coatings on glass substrates, special attention is paid to sol-gel technology as technically simple and having wide functional capabilities. The optical properties of the coatings were assessed by their spectral-optical characteristics of reflection and transmission in the range of 300–1000 nm.

Received: 11 April 2025 | Revised: 5 September 2025 | Accepted: 28 September 2025

Conflicts of Interest

The authors declare that they have no conflicts of interest to this work.

Data Availability Statement

Data sharing is not applicable to this article as no new data were created or analyzed in this study.

Author Contribution Statement

Nickolay M. Ushakov: Writing – original draft, Writing – review & editing, Visualization, Supervision, Project administration. I. D. Kosobudskiy: Validation, Formal analysis. M. Yu. Vasilkov: Investigation, Resources.