ZHANG, Hongzhi; VARLAMOVA, L. P.; CHEN, Jianan. Integrating Leaf-Image Deep Learning, Meteorological Risk-State Discovery, and Stochastic SICR Dynamics for Potato Early and Late Blight: A Data-Science and Intelligent-Systems Framework. Journal of Data Science and Intelligent Systems, [S. l.], v. 4, n. 4, p. 416–429, 2026. DOI: 10.47852/bonviewJDSIS620210658. Disponível em: https://ojs.bonviewpress.com/index.php/jdsis/article/view/10658. Acesso em: 31 oct. 2026.