Nematov D. Analysis of the Optical Properties and Electronic Structure of Semiconductors of the Cu2NiXS4 (X = Si, Ge, Sn) Family as New Promising Materials for Optoelectronic Devices. JOPR [Internet]. 2024 May 22 [cited 2026 Mar. 4];1(2):91-7. Available from: https://ojs.bonviewpress.com/index.php/JOPR/article/view/1819