NEMATOV, Dilshod. Analysis of the Optical Properties and Electronic Structure of Semiconductors of the Cu2NiXS4 (X = Si, Ge, Sn) Family as New Promising Materials for Optoelectronic Devices. Journal of Optics and Photonics Research, [S. l.], v. 1, n. 2, p. 91–97, 2024. DOI: 10.47852/bonviewJOPR42021819. Disponível em: https://ojs.bonviewpress.com/index.php/JOPR/article/view/1819. Acesso em: 22 dec. 2024.