RAHMAN, Anis. GaN Lattice Damage and GaN-HEMT Metrology by Cameraless T-ray Imaging and Time-Domain Spectroscopy. Journal of Optics and Photonics Research, [S. l.], v. 3, n. 3, p. 248–256, 2026. DOI: 10.47852/bonviewJOPR52025068. Disponível em: https://ojs.bonviewpress.com/index.php/JOPR/article/view/5068. Acesso em: 21 sep. 2026.