ISHENGOMA, Farian S.; TELEMALA, Joseph P. Integrating Pattern Recognition and CNN-Based Models for Improved Bean Disease Detection and Agricultural Yield Enhancement. Artificial Intelligence and Applications, [S. l.], 2025. DOI: 10.47852/bonviewAIA52024376. Disponível em: https://ojs.bonviewpress.com/index.php/AIA/article/view/4376. Acesso em: 15 sep. 2025.