ISHENGOMA, Farian S.; TELEMALA, Joseph P. Integrating Pattern Recognition and CNN-Based Models for Improved Bean Disease Detection and Agricultural Yield Enhancement. Artificial Intelligence and Applications, [S. l.], v. 3, n. 4, p. 385–391, 2025. DOI: 10.47852/bonviewAIA52024376. Disponível em: https://ojs.bonviewpress.com/index.php/AIA/article/view/4376. Acesso em: 29 oct. 2025.